ABOUT MEIE

A Professional, Open, Innovative Platform
for Experts and Delegates from Academia and Industry

MEIE aims to provide an annual platform for experts and participants from academia and industry, through workshops, invited lectures, and oral and poster sessions, and to present research findings in the state-of-the-art areas of mechanical engineering, electric engineering, and industrial engineering.

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Previous Conferences	Conference Delegates	Universities/Institutes	Proceeding Articles

Dear Colleagues and Friends,

Welcome to MEIE2026!

The 9th International Conference on Mechanical, Electrical and Industrial Engineering (MEIE2026) will be held in Guiyang, China during August 14-16, 2026. It is organized by the School of Mechanical Engineering at Guizhou University, the School of Mechanical Engineering at Shanghai Jiao Tong University, co-organized by Key Laboratory of Advanced Manufacturing Technology of the Ministry of Education at Guizhou University, Chinese Institute for Quality Research, Taiyuan University of Science and Technology, Journal of Reliability Science and Engineering, Journal of Electronics & Information Technology, and School of Physics and Mechatronic Engineering at Guizhou Minzu University. On behalf of the Organizing Committee, we warmly welcome you to participate in MEIE2026 technical discussions and accompanying programs.

MEIE aims to provide an annual platform for experts and participants from academia and industry, through workshops, invited lectures, and oral and poster sessions, and to present research findings in the state-of-the-art areas of mechanical engineering, electric engineering, and industrial engineering.

Over the last 8 years, MEIE has been held in various locations, including in-person conferences in Hangzhou (2018 & 2019), an online conference for COVID-19 (2020), a hybrid event in Kunming (2021), an online conference (2022), a hybrid event in Sanya (2023), and a hybrid event in Yichang (2024) and Taiyuan (2025), attracted participants from more than 15 countries and regions including Sweden, Canada, the United States, Australia, Singapore, South Korea, and Malaysia. Published conference proceedings have been retrieved by EI Compendex and Scopus.

In recent years, the application of intelligence to manufacturing has emerged as a compelling topic for researchers and industries. Industrial upgrading and transformation move toward digitalization, networking, and intelligence in manufacturing. MEIE 2026 focuses on Intelligent Manufacturing and highlights in hot topics such as Industrial Internet, Intelligent Machines, Intelligent Manufacturing Systems, Semiconductor Devices, Optical Ultra-Precision Manufacturing and Photoelectric Sensors, to bridge the research community and practitioners in industry.

PROGRAM

Parallel Sessions

Awards Setting

To encourage academic exchange, the MEIE2026 conference will confer awards such as Best Paper Award, Outstanding Young Scholar Award, Best Oral Presentation Award, Best Poster Award, etc.
MEIE2026 sincerely welcomes senior scholars, young scholars, student researchers, journal representatives, and industry delegates to participate actively, engage in in-depth exchanges, and foster collaboration.

NEWS

2025.12.4 MEIE2025 proceedings were published online, click here for checking.

2025.7.15 MEIE2025 was successfully held in Taiyuan, China during July 12-14, 2025. Please check MEIE2025 Conference Overview here.

2024.11.14 MEIE2024 Proceedings have been indexed by EI Compendex and Scopus one month after the publication.

2024.10.16 MEIE2024 proceedings were published online, click here for checking.

2024.5.31 MEIE2024 was successfully held in Yichang, China during May 21-23, 2024. Please check MEIE2024 Conference Overview here.

2023.10.12 MEIE2023 proceedings were published online and included in EI Compendex, Scopus.

2023.05.27 MEIE2023 was successfully held on May 23-25, 2023 in Sanya, China and online. Click here for Conference Overview.

2023.05.20 Previous MEIE conferences were all successfully held, proceedings were published and indexed by EI Compendex, Scopus.